2 article(s) from Ibarra, Manuel Ricardo
(a) Scheme of the experiment performed to measure the electrical resistance under perpendicular mag...
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Cross-sectional SEM micrographs of a sample with 60 nm pitch (a), a sample with 100 nm pitch (b) an...
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Scanning transmission electron microscopy (STEM) study of the sample with pitch 100 nm. (a) STEM-HA...
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(a) Magnetoresistance curves of the sample with 100 nm pitch at 1.9 K (0.43Tc), 2.2 K (0.49Tc), 2.5...
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Magnetoresistance curves at 2.5 K of the flat sample, and samples with 60, 80, 100, 120 and 140 nm ...
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Dependence of the magnetic fields where local minima in the resistance are experimentally observed,...
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Comparison of the critical current density and the resistance versus magnetic field of the sample w...
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Magnetoresistance measurements for the sample with pitch 60 nm and values of T0 obtained from the f...
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Beilstein J. Nanotechnol. 2016, 7, 1698–1708, doi:10.3762/bjnano.7.162
(a) Topography and (b) frequency shift images corresponding to the Co wires; (d) topography and (e)...
(a) Topography of the Co wire. The dashed line corresponds to continuous scanning along the profile...
Topography of (a) Co nanowires and (e) L-shaped Co nanostructure. (b) and (f) frequency shift image...
(a) Sketch of the different feedback loops used to perform MFM measurements with PLL system activat...
Beilstein J. Nanotechnol. 2011, 2, 552–560, doi:10.3762/bjnano.2.59
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