2 article(s) from Kratzer, Markus
Quantitative estimation of nanoparticle/substrate adhesion by atomic force microscopy
- Aydan Çiçek,
- Markus Kratzer,
- Christian Teichert and
- Christian Mitterer
Beilstein J. Nanotechnol. 2026, 17, 1–14, doi:10.3762/bjnano.17.1
Photoresponse from single upright-standing ZnO nanorods explored by photoconductive AFM
- Igor Beinik,
- Markus Kratzer,
- Astrid Wachauer,
- Lin Wang,
- Yuri P. Piryatinski,
- Gerhard Brauer,
- Xin Yi Chen,
- Yuk Fan Hsu,
- Aleksandra B. Djurišić and
- Christian Teichert
Beilstein J. Nanotechnol. 2013, 4, 208–217, doi:10.3762/bjnano.4.21
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