1 article(s) from Kuerbanjiang, Balati
CVR chamber consisting of precursor sources, reaction zone and thermophoretic powder-collection sys...
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X-ray diffraction patterns (Cu Kα radiation) from the TiO2:Eu nanophosphors produced by the CVR met...
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Normalized emission spectra of Eu3+ in TiO2 under excitation at 330 or 390 nm.
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Excitation spectrum of TiO2:Eu nanoparticles detected at 617 nm emission.
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Decay of the TiO2:Eu emission intensity with time for excitation at 330 nm.
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Decay of the TiO2:Eu emission intensity at 617 nm with time for excitation at 460 nm.
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STEM image of TiO2:Eu nanoparticles coated with a shell of 3 nm Al2O3 and TiO2.
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High-resolution TEM image of TiO2 nanoparticles coated with Al2O3 showing that the Al2O3 coating is...
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SEM image of Ag nanoantennas from the nanosphere lithography process (using colloid spheres with 3 ...
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Confocal microscopy images of the Ag nano-antenna structures (produced using 3 μm diameter colloid ...
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Calculated field-enhancement factor (normalized to the amplitude E0 of the incident light) for bowt...
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Field enhancement ratio (scale goes from 0 to 90) for Ag bow-tie nano-antennas with tip-to-edge len...
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Dependence of the field enhancement in the centre of the gap of a bowtie antenna structure on the i...
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Field enhancement ratio for an array of Ag nanoantenna structures with tip-to-edge length of 370 nm...
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SEM image of spin coated TiO2:Eu layer on Ag nanoantenna structures.
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(a) AFM image of the spin coated TiO2:Eu layer. The antenna structure is still visible in this regi...
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Fluorescent intensity obtained by confocal microscopy of spin-coated nanoantenna structures under e...
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Emission spectrum of VTLUNP organic pigment under excitation with 532 nm radiation.
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Excitation spectrum of VTLUNP organic pigment for emission at 614 nm.
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(a) AFM image of Ag nanoantennas spin coated with VTLUNP (b) AFM height profiles along the lines 1 ...
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Representative scattering (a, c) and fluorescence (b, d) images of the samples spin coated with VTL...
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Representative fluorescence images (recorded at 614 nm) of samples without SiOx layer (a, b) and sa...
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Beilstein J. Nanotechnol. 2013, 4, 306–317, doi:10.3762/bjnano.4.34
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