2 article(s) from Lamperti, Alessio
(a) Zirconia containing two Ni atoms substituting Zr atoms without O vacancies, that is, structure S...
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Relaxed nickel geometries and crystal-field splitting diagrams for different Ni-doped zirconia cont...
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(a) O K-edge spectra of pure zirconia (blue curve) and of nickel-doped zirconia (ZrO2:Ni) at x = 6....
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Projected densities of states (PDOS) of nickel atoms Ni1 and Ni2. The solid line corresponds to spi...
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Beilstein J. Nanotechnol. 2022, 13, 975–985, doi:10.3762/bjnano.13.85
XRR experimental curves and data fitting of the (a) CeO2/TiN and (b) CeO2/Si: as deposited (blue sy...
ToF-SIMS depth profiles of (a) CeO2/TiN as-deposited (RT) and annealed at 400 and 600 °C in N2 and ...
TEM image (cross-sectional view) of CeO2 on TiN annealed at 600 °C.
XPS spectra (both experimental and fitting curves) collected at 45° take-off angle of (a) CeO2/TiN ...
TEM image (cross-sectional view) of CeO2 on Si annealed at 900 °C.
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GIXRD profiles of (a) CeO2/TiN and (b) CeO2/Si as-deposited and in situ annealed during acquisition...
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Fraction of the crystalline planes oriented in each respective crystalline direction as a function ...
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TEM image (plan-view) of CeO2 on Si annealed at 900 °C. Inset: histogram showing the grain size dis...
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High-resolution TEM image (plan-view) of CeO2 on Si annealed at 900 °C. The lattice fringes of (111...
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Beilstein J. Nanotechnol. 2018, 9, 890–899, doi:10.3762/bjnano.9.83
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