1 article(s) from Logvenov, Gennady
Photo of the dual chamber ALL-oxide MBE system installed in the Max-Planck Institute for Solid Stat...
Jump to Figure 1
Sketch of the growth chamber.
Jump to Figure 2
AFM image of 25 nm thick La2NiO4 film on STO substrate.
Jump to Figure 3
AFM image of 25 nm thick La2CuO4 film on LSAO substrate.
Jump to Figure 4
XRD θ–2θ scan of a bilayer heterostructure La2NiO4 (diamonds)–La2CuO4 (circles) on a STO(100) subst...
Jump to Figure 5
Resistivity versus temperature for the parent compound La2CuO4 and for the superconducting La2CuO4+δ...
Jump to Figure 6
XRD θ–2θ scan of 13 nm thick La1Sr1NiO4 on LSAT(100) (S). Laue fringes can be seen in the left inse...
Jump to Figure 7
Resistivity versus temperature for La2−xSrxNiO4 with different doping levels.
Jump to Figure 8
Beilstein J. Nanotechnol. 2014, 5, 596–602, doi:10.3762/bjnano.5.70
Subscribe to our Latest Articles RSS Feed.
Register and get informed about new articles.
Follow the Beilstein-Institut