1 article(s) from Luria, Justin
pcAFM measurement of a CdTe/CdS solar cell, during specimen illumination from below through an unde...
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(a) Consecutively acquired ISC* (note the log scale) and (b) directly measured VOC* for a single ca...
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(a) SEM micrograph of a locally planarized polycrystalline CdTe solar cell. The dotted rectangular ...
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Three-dimensional CT-AFM of the short-circuit current (ISC*, dark to blue contrast) merged with the...
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Beilstein J. Nanotechnol. 2018, 9, 1802–1808, doi:10.3762/bjnano.9.171
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