1 article(s) from Ma, Chengfu
(a) Schematic illustration of CR-AFM imaging on the flexible circuit sample. (b) An enlarged sectio...
Jump to Figure 1
Subsurface imaging of the flexible circuit sample with a top layer thickness of 52 nm measured via ...
Jump to Figure 2
Influence of the applied force on CR-AFM subsurface imaging of the flexible circuit sample with a 5...
Jump to Figure 3
Influence of cantilever stiffness on CR-AFM subsurface imaging of the flexible circuit sample with ...
Jump to Figure 4
The influence of cantilever oscillation eigenmode on CR-AFM subsurface imaging of a flexible circui...
Jump to Figure 5
Influence of cover thickness on CR-AFM subsurface imaging of the circuit sample. (a–e) Frequency im...
Jump to Figure 6
Influence of thickness and material properties of each layer on subsurface imaging of the circuit p...
Jump to Figure 7
Optimization of CR-AFM subsurface imaging on a flexible circuit sample. (a,b) CR-AFM frequency imag...
Jump to Figure 8
Subsurface imaging of defects in the buried circuit pattern using CR-AFM. (a) Schematic illustratio...
Jump to Figure 9
Beilstein J. Nanotechnol. 2019, 10, 1636–1647, doi:10.3762/bjnano.10.159
Subscribe to our Latest Articles RSS Feed.
Register and get informed about new articles.
Follow the Beilstein-Institut