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Beilstein J. Nanotechnol. 2025, 16, 1942–1951, doi:10.3762/bjnano.16.135
Figure 1: (a) SEM secondary electron images showing thickness and morphology of the precursor layers of 1–4. ...
Figure 2: (a) SEM BSE morphology evolution studies of precursor 4 layer decomposition during gallium FIB irra...
Figure 3: (a) Results of the SEM EDX hyperspectral mapping analysis of the precursor 4 layer after gallium FI...
Figure 4: Investigation of chemical composition (precursor performance) for the studied precursors 1–4 after ...
Beilstein J. Nanotechnol. 2018, 9, 842–849, doi:10.3762/bjnano.9.78
Figure 1: Scanning electron micrographs of deposits from (a, e) AgO2Me2Bu and (b, f) AgO2F5Prop using a beam ...
Figure 2: Dwell-time series for a beam current of 150 pA using (a) AgO2Me2Bu and (b) AgO2F5Prop as precursor ...
Figure 3: Scanning electron micrographs of single silver pillars obtained after continuous spot irradiation f...
Beilstein J. Nanotechnol. 2018, 9, 224–232, doi:10.3762/bjnano.9.24
Figure 1: Scanning electron micrographs of deposits from AgO2CC2F5 on bulk 200 nm SiO2/Si using a 25 keV/0.25...
Figure 2: SEM images of box deposits with the same electron dose of 7.44 nC/µm2 but different dwell and refre...
Figure 3: Images of a line deposit on a carbon membrane. (a) Scanning electron micrograph of the line deposit...
Figure 4: Dark field scanning transmission electron micrographs of the line deposit. (a) Overview image of th...
Figure 5: LineTV: FEBID line connecting four gold electrodes for four point probe measurements on bulk SiO2/S...
Figure 6: Transmission electron micrographs of the carbon membrane after deposition. (a) Typical dark field S...