3 article(s) from Majzik, Zsolt

Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature

  1. Mykola Telychko,
  2. Jan Berger,
  3. Zsolt Majzik,
  4. Pavel Jelínek and
  5. Martin Švec
  • Full Research Paper
  • Published 07 Apr 2015

  • PDF

Beilstein J. Nanotechnol. 2015, 6, 901–906, doi:10.3762/bjnano.6.93

Characterization of the mechanical properties of qPlus sensors

  1. Jan Berger,
  2. Martin Švec,
  3. Martin Müller,
  4. Martin Ledinský,
  5. Antonín Fejfar,
  6. Pavel Jelínek and
  7. Zsolt Majzik
  • Full Research Paper
  • Published 02 Jan 2013

  • PDF

Beilstein J. Nanotechnol. 2013, 4, 1–9, doi:10.3762/bjnano.4.1

Simultaneous current, force and dissipation measurements on the Si(111) 7×7 surface with an optimized qPlus AFM/STM technique

  1. Zsolt Majzik,
  2. Martin Setvín,
  3. Andreas Bettac,
  4. Albrecht Feltz,
  5. Vladimír Cháb and
  6. Pavel Jelínek
  • Full Research Paper
  • Published 15 Mar 2012

  • PDF

Beilstein J. Nanotechnol. 2012, 3, 249–259, doi:10.3762/bjnano.3.28

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