1 article(s) from Marszalek, Tomasz
Schematic representation of the deposition process of Parylene C with the respective chemical react...
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AFM measurements of the surface roughness of Parylene C thin films. Reprinted with permission from ...
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XRD spectra of Parylene C films: as-deposited with constant deposition rate and thermally annealed ...
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Schematic illustration of the flexible OFET fabrication procedure with Parylene C as a substrate an...
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Transfer characteristics of 10 OTFTs after bending and crumpling tests: (a) Photograph of a device ...
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Thin Parylene C layers breakdown voltage as a function of thickness. Reprinted with permission from ...
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(a) Mobility μ(Vg) curves measured for four different gate insulators. For the device based on Pary...
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10 μm × 10 μm AFM images of tetracene thin films on different dielectric surfaces at different nomi...
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(a) Transistor architecture of the three different transistor stacks investigated, (b) threshold vo...
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Transfer characteristics measured during the continuous bias stress of 125 h. (a) Bottom-gate, top-...
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Volumetric reconstruction of the Parylene C-coated microscopy glass (left, atop) and calculated amp...
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Volumetric reconstruction of the Parylene C-coated OFET structure (left, atop) and calculated ampli...
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Transfer characteristics recorded under ambient conditions of a fullerene transistor without encaps...
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Beilstein J. Nanotechnol. 2017, 8, 1532–1545, doi:10.3762/bjnano.8.155
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