NANOSCIENCE – THEORY TO APPLICATION

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1 article(s) from Mathias, Thomas

Mechanical property measurements enabled by short-term Fourier-transform of atomic force microscopy thermal deflection analysis

Thomas Mathias,
Roland Bennewitz and
Philip Egberts

Beilstein J. Nanotechnol. 2025, 16, 1952–1962, doi:10.3762/bjnano.16.136

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Figure 1: (a) Schematic diagrams of the cantilever models used in determining the dispersion curves to conver...

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Figure 2: (a) Force-versus-displacement curve using the high-sample rate acquisition system. (b) Fourier tran...

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Figure 3: (a) Resonant frequency versus normal force determined from fits of the first normal resonant mode p...

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Figure 4: Experimental data for four sample combinations tested (silicon tips on HOPG, diamond-coated tips on...

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Figure 5: Contact stiffness versus normal force for (a) a silicon probe on HOPG sample (yellow squares) (b) a...

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Figure 6: (a, b) Scanning electron microscopy images of the borosilicate glass colloid glued onto the tipless...

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Full Research Paper

Published 06 Nov 2025

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