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Beilstein J. Nanotechnol. 2025, 16, 700–710, doi:10.3762/bjnano.16.54
Figure 1: a) SPEM image of the Cr0.78Ti0.36Se2 single crystal obtained at the area corresponding to the Se 3d...
Figure 2: Surface characterization of InP p–n junction nanowires: a) sketched structure (top), AFM image (mid...
Figure 3: XPS spectra from a) Ni 3p, b) O 1s core levels, and c) valence band region from NiO samples sintere...
Figure 4: Geometrical displacement of the SPEM focusing optical elements, sample, and electron analyzer.