1 article(s) from Meuer, Daniel

Impact of thermal frequency drift on highest precision force microscopy using quartz-based force sensors at low temperatures

  1. Florian Pielmeier,
  2. Daniel Meuer,
  3. Daniel Schmid,
  4. Christoph Strunk and
  5. Franz J. Giessibl
  • Letter
  • Published 04 Apr 2014

  • PDF
Graphical Abstract

Beilstein J. Nanotechnol. 2014, 5, 407–412, doi:10.3762/bjnano.5.48

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