NANOSCIENCE – THEORY TO APPLICATION

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1 article(s) from Mitterer, Christian

Quantitative estimation of nanoparticle/substrate adhesion by atomic force microscopy

Aydan Çiçek,
Markus Kratzer,
Christian Teichert and
Christian Mitterer

Beilstein J. Nanotechnol. 2026, 17, 1–14, doi:10.3762/bjnano.17.1

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Figure 1: Schematics of the NP manipulation method using an AFM in contact mode. (a) The tip approaches and s...

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Figure 2: AFM topography images (1 × 1 µm²) of Cu NPs on Si deposited at a bias voltage of 10 V with a scan a...

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Figure 3: (a) Relationship between the average lateral force necessary to push Cu NPs on Si and the applied b...

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Figure 4: (a) Cropped AFM image of Cu NPs deposited at a bias voltage of 1000 V onto Si, z-scale of 14 nm. Th...

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Figure 5: Work of separation as a function of NP diameter determined for Cu NPs deposited at a bias voltage o...

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Figure 6: Relationship between work of separation and NP diameter at different substrate bias voltages. In ad...

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Figure 7: Deviation from the adhesion threshold F₀ − 6πRγ as a function of NP diameter under varying substrat...

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Published 02 Jan 2026

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