2 article(s) from Noor, Nafisa
Figure 1: Schematic of the procedure used in this work for extraction of amorphized length in phase-change me...
Figure 2: (a) Temperature profile used for annealing the as-fabricated amorphous devices to the crystalline p...
Figure 3: Schematic of the measurement sequence. One or more pulses were applied to initially reset the cryst...
Figure 4: Repeated post-reset pulses of 200 ns duration and 0.4 to 10.0 V amplitude (with an increment of 0.1...
Figure 5: Schematic illustration of the calculation of the amorphized length for two post-reset re-amorphizat...
Figure 6: (a) Approximate circuit model of an experimental setup with measured parasitic capacitance and resi...
Figure 7: (a) Logarithmic upward drift of the threshold field Ethreshold(t) for 25 identical cells [20,29] as a func...
Figure 8: Representative SEM images of six physically broken cells with lost connections, showing significant...
Figure 1: (a) SEM image of the ZnO nanorods grown on ≈100 nm thick, highly doped, patterned, p-type, silicon ...
Figure 2: The schematics of a typical measurement setup with a pulse generating unit (PGU). An optical spectr...
Figure 3: Frames extracted from high-speed videos showing light emission and changing percolation paths durin...
Figure 4: Frames extracted from high-resolution videos showing light emission from the ZnO nanorods contacted...
Figure 5: (a) Optical emission spectra obtained from DC voltage sweeping of 0–80 V (blue), AC excitation with...
Figure 6: (a) Spectrum of the light emission resulting from application of a single pulse with amplitude of 4...
Figure 7: Scanning electron microscope image of the molten path due to the current flow between the contacts ...
Figure 8: Optical microscope images showing two tungsten probes placed on a continuous ZnO nanoforest before ...
Figure 9: (a) I–V characteristics for two DC voltage sweep measurements from 0–60 V performed in vacuum (red)...