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Beilstein J. Nanotechnol. 2025, 16, 887–898, doi:10.3762/bjnano.16.67
Figure 1: NEXAFS C K-edge spectra of PCD and Ni-PCD films after high-vacuum annealing at 1100 °C, measured in...
Figure 2: XPS C 1s spectra of PCD and Ni-PCD films after high-vacuum annealing at 1100 °C, measured at excita...
Figure 3: a) XPS Ni 3p spectrum measured at 830 eV and b) NEXAFS Ni L-edge spectra recorded in TEY and AEY mo...
Figure 4: SEM images of crystallites with different faces in annealed PCD and Ni-PCD films.
Figure 5: Raman spectra of a) PCD and b) Ni-PCD films after annealing in high vacuum at 1100 °C. The spectra ...
Figure 6: NEXAFS C K-edge spectra measured in TEY mode for a) bare and b) Ni-coated (110) face of SCD after h...