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Beilstein J. Nanotechnol. 2025, 16, 1129–1140, doi:10.3762/bjnano.16.83
Figure 1: Low- and high-resolution fast-AFM scans of two different locations on a Celgard® 2400 membrane surf...
Figure 2: Low- and high-resolution AFM scans of two different locations on a titanium film, as well as the up...
Figure 3: p-Values for six different metrics (PSNR, SSIM, Fourier Sharpness, PI, Ma, and NIQE) for the two da...
Figure 4: AFM expert survey results. Three experts were asked to judge a blind set of samples and to score ea...
Figure 5: Example of an image set given to AFM experts as part of the survey. The dpi was set to 1000 to ensu...
Beilstein J. Nanotechnol. 2024, 15, 134–143, doi:10.3762/bjnano.15.13
Figure 1: (A) In ORT modes, consecutive force-versus-distance curves are generated with a periodic Z displace...
Figure 2: (A) Deflection values during the interaction window (shadowed in blue color), which is selected aro...
Figure 3: The tracking performance of both methods was evaluated in an experimental setup (A) where a scanner...
Figure 4: A grid sample was scanned with both methods to compare the image quality and the tracking performan...
Figure 5: Both methods are used to image PS/LDPE. The height image of the sample in panel (A) was captured us...