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Beilstein J. Nanotechnol. 2026, 17, 1016–1027, doi:10.3762/bjnano.17.69
Figure 1: Chemical composition of CuZnTeO films as a function of the nominal Cu and O concentration in target...
Figure 2: X-ray diffraction patterns of ZnTe and CuZnTeO films as a function of nominal Cu and O concentratio...
Figure 3: Deconvolution of the main peak the (111) plane of the cubic phase and the (200) plane of the hexago...
Figure 4: Surface micrograph and Raman spectra of CuZnTeO film with a nominal concentration of 3 atom % of Cu...
Figure 5: SEM images and X-ray diffraction of CuZnTeO films with nominal concentration of Cu and O of 3 atom ...
Figure 6: Transmittance spectra and SEM micrographs of CuZnTeO films grown on glass substrates as a function ...
Figure 7: Electrical charge transport properties of CuZnTeO films grown on glass substrates as a function of ...
Beilstein J. Nanotechnol. 2020, 11, 703–716, doi:10.3762/bjnano.11.58
Figure 1: Experimental setup for S-AFAM, using a NI PXIe-1073 device and a function waveform generator HP/Agi...
Figure 2: Contact resonance frequencies for a graphite film on a glass substrate. a) Resonance flexural modes...
Figure 3: AFM system, the piezoelectrical signal excitation is considered to be the input, while the deflecti...
Figure 4: PSD simulation. a) Free cantilever: L = 300 μm(blue line), L = 400 μm (dashed red line) and L = 500...
Figure 5: Flexural resonance frequencies as a function of the contact stiffness for a cantilever with the fol...
Figure 6: Results for a graphite film on a glass substrate. a) Conventional AFM topography; b) RT-AFAM for 18...
Figure 7: Results for a graphite film on a glass substrate: a) indentation modulus mapping and b) histogram f...