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Beilstein J. Nanotechnol. 2026, 17, 251–261, doi:10.3762/bjnano.17.17
Figure 1: (a) Bilayer structure design. The metal and dielectric layers are characterized, respectively, by t...
Figure 2: (a) Simulated real part of the perpendicular component of the permittivity of the Au/TiO2 multilaye...
Figure 3: (a) Transmittance of the stacks with fixed gold layer dm = 10 nm measured using spectrophotometry. ...
Figure 4: (a) Scanning electron microscopy image of the ML800 structure. We see that the deposited layers hav...
Figure 5: (a) OA z-scan results. The solid line is the fit using the method presented in [31]; we successfully em...
Figure 6: The nonlinear refractive index n2 as a function of the ENZ point wavelength. We found a clear enhan...
Figure 7: Peak-to-valley transmittance differences ΔTP−V as a function of the chopper frequency for the sampl...