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1 article(s) from Rauf, Muhammad

Thickness dependent oxidation in CrCl₃: a scanning X-ray photoemission and Kelvin probe microscopies study

Shafaq Kazim,
Rahul Parmar,
Maryam Azizinia,
Matteo Amati,
Muhammad Rauf,
Andrea Di Cicco,
Seyed Javid Rezvani,
Dario Mastrippolito,
Luca Ottaviano,
Tomasz Klimczuk,
Luca Gregoratti and
Roberto Gunnella

Beilstein J. Nanotechnol. 2025, 16, 749–761, doi:10.3762/bjnano.16.58

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Figure 1: (a) Optical contrast and (b) AFM images of mechanically exfoliated CrCl₃ flakes on the native Si (1...

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Figure 2: Optical contrast on ITO substrates (a) before and (b) after the SPEM measurements. (c, d) AFM topog...

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Figure 3: A schematic of experimental SPEM setup in the case of a few layer CrCl₃ flake [27]. The lower part of t...

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Figure 4: Survey spectra of exfoliated CrCl₃ flakes on native Si oxide substrate with different beam modes at...

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Figure 5: Cl 2p and Cr 2p₃_/₂ core level SPEM maps with focused beam at RT on 1 nm SiO₂/Si substrate. (a) Cl 2...

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Figure 6: Cl 2p (a, b) (map and spectrum) and Cr 2p₃_/₂ (c, d) (map and spectrum) core level maps at binding e...

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Figure 7: SPEM spectra from thick (T) and lean (L) areas on ITO. (a) SPEM image to verify the area of interes...

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Figure 8: CrCl₃ on SiO₂/Si substrate. (a) Topography from non-contact mode AFM of two flakes with different t...

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Figure 9: (a)Topography from non-contact mode AFM of flakes with two different thickness deposited on ITO; (b...

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Figure 10: Valence band spectra acquired at point L (lean) and point T (thick). The spectra were aligned with ...

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Figure 11: The surface potential values of CrCl₃ flakes after several experiments as function of the flake thi...

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Published 02 Jun 2025

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Thickness dependent oxidation in CrCl3: a scanning X-ray photoemission and Kelvin probe microscopies study

Thickness dependent oxidation in CrCl₃: a scanning X-ray photoemission and Kelvin probe microscopies study