1 article(s) from Reichling, M.
Micro-Raman spectrum for both, the substrate and the SLG flake introduced in Figure 3. The inset shows the ...
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Roughness analysis of NC-AFM images taken on a single terrace within 70 × 70 nm2 on the 6H-SiC(0001...
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Tapping mode AFM image (a) of an exfoliated SLG flake on 6H-SiC(0001) showing examples of rupture a...
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NC-AFM image (a) of an exfoliated SLG flake on 6H-SiC(0001), irradiated with SHI and subjected to p...
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(a) LCPD image of the folding marked by A in Figure 4. (b) The profile taken in the corresponding NC-AFM im...
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(a) NC-AFM image of the region marked by B in Figure 4, where post-preparation treatment resulted in the fo...
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NC-AFM image of the region marked C in Figure 4 with foldings due to SHI impact on the left and right of th...
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Beilstein J. Nanotechnol. 2013, 4, 625–631, doi:10.3762/bjnano.4.69
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