1 article(s) from Rezvani, S. Javad
SEM images of the morphological evolution of strained Mn wetting layers with different thickness af...
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X-ray diffraction pattern of the 9 ML thick Mn wetting layer, upon annealing at 650 °C for 15 min. ...
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SEM images of the surface after deposition of 4.5 ML Mn on Ge(111) wafer and annealing at 650 °C fo...
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(a) SEM image of a typical NW, ≃700 nm long, obtained by deposition of a 4.5 ML thick Mn film follo...
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EDX elemental map (Kα line), carried out on a cross-section of a NW on the surface of the 4.5 ML th...
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Cross-section image of the NW along its length. (a) TEM image of a 1.15 μm long NW capped with a Pt...
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(a) Length (t) and width (s) of Mn5Ge3 islands, formed on the sample surface of the 4.5 ML thick Mn...
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Beilstein J. Nanotechnol. 2021, 12, 366–374, doi:10.3762/bjnano.12.30
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