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Beilstein J. Nanotechnol. 2026, 17, 1200–1211, doi:10.3762/bjnano.17.83
Figure 1: (a) Photograph of the customized tribometer installed inside a vacuum chamber. (b) Two-dimensional ...
Figure 2: AFM topography acquired from (a) the sapphire apex and (b) the chromium film. (c) Scale-dependent r...
Figure 3: AFM height maps of the sapphire apex (a) before and (b) after fretting from a 34 μm × 34 μm scan ar...
Figure 4: AFM topography images of the chromium-coated wafer (a) before and (b) after fretting, acquired over...
Figure 5: Adhesion maps of (a) the sapphire apex and (b) the wear scar on the chromium surface after fretting...
Figure 6: Schematic illustration of the local evolution of a representative microcontact within the multiaspe...
Figure 7: Formation of the peripheral debris ring during sapphire–chromium contact. (a) Schematic illustratio...