1 article(s) from Ronda, Antoine
SEM images acquired during APT sample preparation in a dual-beam FIB process. The image sequence (a...
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Sketch of the sample structure and AFM measurements performed on the sample surface after MBE growt...
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APT volume (100 × 100 × 90 nm3) obtained from the sample. Green, gray, red and blue dots correspond...
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Top-down, 1D Ge concentration profiles measured between the islands in two different samples. The p...
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Cross-sectional TEM image of a typical dome island (a), and side-views of two different APT volumes...
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APT volume showing 2% of the Ni atoms, 5% of the Ge atoms, and 100% of the O atoms (the Si atoms ar...
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Top-down 1D Ge concentration profiles measured in two different APT volumes, one in the direction p...
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APT analysis: (a) 3D volume (120 × 120 × 100 nm3), (b) 2D map of the Ge concentration distribution ...
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(a) APT volume (90 × 90 × 130 nm3) and (b) Si and Ge 1D concentration profiles measured in (a). Figure 9c in...
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(a) APT volume (70 × 70 × 85 nm3) and (b) Si and Ge 1D concentration profiles measured in this volu...
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APT measurements obtained for four APT volumes (green and red surfaces) which form almost half of a...
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Beilstein J. Nanotechnol. 2014, 5, 2374–2382, doi:10.3762/bjnano.5.246
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