2 article(s) from Salvat-Pujol, Francesc
Example incoming trajectories (dotted lines) in the surface-scattering zone (typically 15 Å above a...
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Comparison of reflection-electron-energy-loss spectra (REELS) of Si (left) and Cu (right) under bom...
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Simulation geometry: 1 keV electrons impinge normally onto the material (Si or Cu); all backscatter...
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(Upper panel) Reflection-electron-energy-loss spectrum (REELS) of Si under 100 eV bombardment (see ...
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Same as Figure 4 with the inclusion of surface excitations in the modelling of electron transport through t...
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Beilstein J. Nanotechnol. 2015, 6, 1260–1267, doi:10.3762/bjnano.6.129
Schematic representation of a random trajectory generated by PENELOPE . The trajectory is determine...
Cylindrical sample geometries used in the simulations. Top: A 300 nm thick amorphous SiO2 substrate...
Snapshot of 50 simulated electron trajectories in the SiO2 substrate (left) and in the nanostructur...
Inelastic mean free paths for the relevant materials in this work presented in the usual log–log sc...
(a) Distribution of electrons backscattered and emitted into the vacuum from the substrate in absen...
Distribution of electrons backscattered and emitted into the vacuum from the substrate in the absen...
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Energy deposited in the system as a function of the depth z for the indicated sample thicknesses dW...
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Same as Figure 7 for a fixed deposit density (ρ = 10.6092 g/cm3) and a variable tungsten content.
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IMFP in the different deposits with fixed density (ρ = 10.6092 g/cm3) and a variable tungsten conte...
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Same as Figure 7 for a fixed composition (27.5% W, 50.4% C, 22.1% O) and a variable density.
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IMFP in different deposits with fixed composition (27.5% W, 50.4% C, 22.1% O) and a variable densit...
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Charge deposited into the system as a function of the depth z for the indicated sample thicknesses d...
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Distribution of energy deposited in WC1.75O0.75 as a function of the depth z and the radial coordin...
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Same as Figure 13 for the charge deposited in WC1.75O0.75.
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Beilstein J. Nanotechnol. 2013, 4, 781–792, doi:10.3762/bjnano.4.89
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