1 article(s) from Scholz, Maik
SEM overview images in back scattering electron (BSE) contrast mode for the as-prepared samples of ...
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SEM overview images in BSE contrast of the annealed samples of Fe50Co50@CNT (at 600 °C for 48 h) pr...
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TEM bright field images for the a) as-prepared and b) annealed samples of Fe50Co50@CNT prepared by ...
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Histograms representing the distribution of the inner diameter (nm) of the CNTs and particle diamet...
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XRD diffraction patterns for the as-prepared and annealed samples of Fe50Co50@CNT prepared by the a...
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Relative sample mass loss for a sample prepared by the first (i.e., solution) approach (black) and ...
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Hysteresis curves measured at a) 300 K and c) 5 K for the annealed and the as-prepared Fe50Co50@CNT...
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Beilstein J. Nanotechnol. 2018, 9, 1024–1034, doi:10.3762/bjnano.9.95
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