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3 article(s) from Silva, Helena

Amorphized length and variability in phase-change memory line cells

Nafisa Noor,
Sadid Muneer,
Raihan Sayeed Khan,
Anna Gorbenko and
Helena Silva

Beilstein J. Nanotechnol. 2020, 11, 1644–1654, doi:10.3762/bjnano.11.147

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Figure 1: Schematic of the procedure used in this work for extraction of amorphized length in phase-change me...

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Figure 2: (a) Temperature profile used for annealing the as-fabricated amorphous devices to the crystalline p...

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Figure 3: Schematic of the measurement sequence. One or more pulses were applied to initially reset the cryst...

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Figure 4: Repeated post-reset pulses of 200 ns duration and 0.4 to 10.0 V amplitude (with an increment of 0.1...

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Figure 5: Schematic illustration of the calculation of the amorphized length for two post-reset re-amorphizat...

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Figure 6: (a) Approximate circuit model of an experimental setup with measured parasitic capacitance and resi...

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Figure 7: (a) Logarithmic upward drift of the threshold field E_threshold(t) for 25 identical cells [20,29] as a func...

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Figure 8: Representative SEM images of six physically broken cells with lost connections, showing significant...

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Full Research Paper

Published 29 Oct 2020

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Analysis of self-heating of thermally assisted spin-transfer torque magnetic random access memory

Austin Deschenes,
Sadid Muneer,
Mustafa Akbulut,
Ali Gokirmak and
Helena Silva

Beilstein J. Nanotechnol. 2016, 7, 1676–1683, doi:10.3762/bjnano.7.160

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Figure 1: MRAM device structure with a stack radius of 10 nm. Materials, with exception of contact regions, a...

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Figure 2: Characteristic J–V curve built from literature [4-7] with similar CoFeB/MgO/CoFeB MTJ with thickness of ...

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Figure 3: Graph of materials properties used in model construction. From top to bottom: Seebeck values of CoF...

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Figure 4: Schematic top-down view and quarter cross-section view of the simulated geometries. The dotted line...

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Figure 5: Thermal profiles of configuration II with SiO₂ passivation with an applied voltage of 0.3 V in “pos...

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Figure 6: Thermal profiles of configuration IV with SiO₂ passivation with an applied voltage of 0.3 V in “pos...

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Figure 7: Results for different passivation materials. T_peak (black circles), T_free (red upward triangles) an...

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Figure 8: T_peak (black circles), T_free (red upward triangle) and T_fixed (blue downward triangles), recorded f...

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Figure 9: Individual heat contributions from Peltier effect and tunneling around the MTJ for configuration I ...

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Full Research Paper

Published 11 Nov 2016

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Blue and white light emission from zinc oxide nanoforests

Nafisa Noor,
Luca Lucera,
Thomas Capuano,
Venkata Manthina,
Alexander G. Agrios,
Helena Silva and
Ali Gokirmak

Beilstein J. Nanotechnol. 2015, 6, 2463–2469, doi:10.3762/bjnano.6.255

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Figure 1: (a) SEM image of the ZnO nanorods grown on ≈100 nm thick, highly doped, patterned, p-type, silicon ...

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Figure 2: The schematics of a typical measurement setup with a pulse generating unit (PGU). An optical spectr...

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Figure 3: Frames extracted from high-speed videos showing light emission and changing percolation paths durin...

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Figure 4: Frames extracted from high-resolution videos showing light emission from the ZnO nanorods contacted...

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Figure 5: (a) Optical emission spectra obtained from DC voltage sweeping of 0–80 V (blue), AC excitation with...

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Figure 6: (a) Spectrum of the light emission resulting from application of a single pulse with amplitude of 4...

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Figure 7: Scanning electron microscope image of the molten path due to the current flow between the contacts ...

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Figure 8: Optical microscope images showing two tungsten probes placed on a continuous ZnO nanoforest before ...

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Figure 9: (a) I–V characteristics for two DC voltage sweep measurements from 0–60 V performed in vacuum (red)...

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Full Research Paper

Published 23 Dec 2015

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