1 article(s) from Simon, Georg H

Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy

  1. Thomas K├Ânig,
  2. Georg H. Simon,
  3. Lars Heinke,
  4. Leonid Lichtenstein and
  5. Markus Heyde
  • Review
  • Published 03 Jan 2011

  • PDF

Beilstein J. Nanotechnol. 2011, 2, 1–14, doi:10.3762/bjnano.2.1

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