1 article(s) from Strehle, Steffen
a) High-resolution TEM image of a segment of a SiNW obtained through Pt-catalyzed growth that exhib...
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a) Representative helium ion microscopy image of a SiNW, which is supported on a Au-coated Si wafer...
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a) Confocal 20 × 20 µm2 image of two intersecting SiNWs on a gold substrate. The yellow square mark...
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a) SEM image of the tip used. b) Optical image of the tip in focus. c) Polarization angle-resolved ...
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a) A shear-force scanning probe microscopy topography image (250 × 250 nm2) of a silicon wire edge....
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a) Topographical image of the top of a SiNW. The dashed arrow shows the region in which the 32 Rama...
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Beilstein J. Nanotechnol. 2020, 11, 1147–1156, doi:10.3762/bjnano.11.99
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