1 article(s) from Sultan, Muhammad Taha
(a) GiXRD diffractograms of MLs annealed from 550–900 °C along with the as-grown MLs. The SiGe crys...
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GIXRD diffractogram (upper part) with zoomed-in view (lower part) of crystallographic plane (111) o...
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XRR plot for as-deposited and annealed (for 1 min) structures. The vertical dashed lines illustrate...
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XTEM images of (a) MLs with 20 nm SiGe layer after 600 °C annealing for 1 min, (b) SAED pattern tak...
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(a) XTEM image of MLs annealed at 600 °C (1 min) showing columnar morphology of SiGe NCs in the fil...
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(a) TEM low-magnification image showing the contrast due to the shearing defects appearing in the S...
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(a) Deconvoluted (Gaussian fit) room-temperature photocurrent spectra of as-grown MLs. (b) Normaliz...
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Beilstein J. Nanotechnol. 2019, 10, 1873–1882, doi:10.3762/bjnano.10.182
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