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1 article(s) from Tholén, Mats O

Low-temperature AFM with a microwave cavity optomechanical transducer

Ermes Scarano,
Elisabet K. Arvidsson,
August K. Roos,
Erik Holmgren,
Riccardo Borgani,
Mats O. Tholén and
David B. Haviland

Beilstein J. Nanotechnol. 2025, 16, 1873–1882, doi:10.3762/bjnano.16.130

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Figure 1: (a–c) Scanning electron micrograph of the probe, featuring a Si–N triangular cantilever released fr...

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Figure 2: (a) Detector output noise equivalent displacement PSD and individual contributions. (b) Noise contr...

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Figure 3: (a) Magnitude and (b) phase of the microwave resonator’s reflection coefficient S₁₁ measured during...

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Figure 4: (a) AM-AFM imaging of the calibration grating over a 1 µm × 1 µm scan area containing a single vert...

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Figure 5: (a) FM-AFM imaging (trace) of the calibration grating over a 1 µm × 0.8 µm scan area. (b, c) Averag...

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Figure 6: (a) SEM image of the second test sample. The zoomed inset highlights the area imaged with FM-AFM in...

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Full Research Paper

Published 24 Oct 2025

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