2 article(s) from Tiing Tiong, Vincent
Samples after adhesion test. (a–c) Mo/SLG; (d–f) Mo/Cr/SLG. (a, d) 100 W, 10 mTorr, (b, e) 150 W, 5...
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Sheet resistivity of Mo/Cr films prepared at different values of sputtering power and pressure.
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Surface SEM images of Mo/Cr films prepared at sputtering power and pressure values of (a) 100 W, 3 ...
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Average surface roughness of Mo/Cr films prepared at different sputtering powers and pressures.
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X-ray diffraction peaks of Mo/Cr films prepared using different values of sputtering power and pres...
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Optical reflectance of Mo/Cr films prepared using different values of sputtering power and pressure....
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XPS depth profile of the Mo/Cr films deposited at 200 W and 3 mTorr.
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J–V characteristics of the CZTS cell with Mo/Cr bilayer back contact.
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Beilstein J. Nanotechnol. 2018, 9, 2700–2707, doi:10.3762/bjnano.9.252
(a) XRD patterns, (b) Raman spectra, (c) TEM image, (d) HRTEM image and (e) SAED pattern of CZTS na...
XPS spectra of CZTS nanocrystals synthesized at 240 °C for 24 h.
(a) XRD patterns and (b) Raman spectra of the hydrothermal products synthesized with different TGA ...
TEM images of CZTS nanocrystals synthesized using (a) 0, (b) 18 and (c) 180 μL of TGA at 240 °C for...
(a) XRD of the precipitate collected from the precursor solution prior to hydrothermal reaction and...
TEM images of (a, b, c) Cu7S4 and Cu1.8S nanocrystals collected prior to hydrothermal reaction and ...
XRD pattern of the precipitate collected from the precursor solution without TGA prior to hydrother...
Schematic illustrations of the formation process for kesterite CZTS nanoparticles.
UV–visible absorption spectra of the CZTS nanocrystals synthesized at different reaction duration a...
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Beilstein J. Nanotechnol. 2014, 5, 438–446, doi:10.3762/bjnano.5.51
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