2 article(s) from Vandervorst, Wilfried
Top-view schematic of the four μ4pp electrodes landed on (a) a single fin and (b) two fins. The ele...
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(a) Measured fin resistance Rfin as a function of fin width Wfin on isolated (triangle) and dense (...
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(a) TEM image of four ca. 20 nm wide Si fins where the measured Rfin is indicated on top of each fi...
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Beilstein J. Nanotechnol. 2018, 9, 1863–1867, doi:10.3762/bjnano.9.178
C-AFM configuration and study of the influence of an applied voltage stress on MnO2 and LMO. (a) Sc...
Combined C-AFM and SIMS analysis of a RF-sputtered LMO film. (a) Schematic of the measurement setup...
Appearance of the ionic hysteresis and influence of Li depletion during preconditioning. (a) The hy...
Beilstein J. Nanotechnol. 2018, 9, 1623–1628, doi:10.3762/bjnano.9.154
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