2 article(s) from Vandervorst, Wilfried

Electrical characterization of single nanometer-wide Si fins in dense arrays

  1. Steven Folkersma,
  2. Janusz Bogdanowicz,
  3. Andreas Schulze,
  4. Paola Favia,
  5. Dirch H. Petersen,
  6. Ole Hansen,
  7. Henrik H. Henrichsen,
  8. Peter F. Nielsen,
  9. Lior Shiv and
  10. Wilfried Vandervorst
  • Full Research Paper
  • Published 25 Jun 2018

  • PDF

Beilstein J. Nanotechnol. 2018, 9, 1863–1867, doi:10.3762/bjnano.9.178

Nanoscale electrochemical response of lithium-ion cathodes: a combined study using C-AFM and SIMS

  1. Jonathan Op de Beeck,
  2. Nouha Labyedh,
  3. Alfonso SepĂșlveda,
  4. Valentina Spampinato,
  5. Alexis Franquet,
  6. Thierry Conard,
  7. Philippe M. Vereecken,
  8. Wilfried Vandervorst and
  9. Umberto Celano
  • Letter
  • Published 04 Jun 2018

  • PDF

  • Supp. Info

Beilstein J. Nanotechnol. 2018, 9, 1623–1628, doi:10.3762/bjnano.9.154

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