1 article(s) from Vereecken, Philippe M
C-AFM configuration and study of the influence of an applied voltage stress on MnO2 and LMO. (a) Sc...
Jump to Figure 1
Combined C-AFM and SIMS analysis of a RF-sputtered LMO film. (a) Schematic of the measurement setup...
Jump to Figure 2
Appearance of the ionic hysteresis and influence of Li depletion during preconditioning. (a) The hy...
Jump to Figure 3
Beilstein J. Nanotechnol. 2018, 9, 1623–1628, doi:10.3762/bjnano.9.154
Subscribe to our Latest Articles RSS Feed.
Register and get informed about new articles.
Follow the Beilstein-Institut