2 article(s) from Vogt, Patrick
Illustration of the increasing buckling of different elemental 2D materials.
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Beilstein J. Nanotechnol. 2018, 9, 2665–2667, doi:10.3762/bjnano.9.248
(a) STM topographic images (Ubias = −1.0 V, I = 1.08 nA) and corresponding low-energy electron diff...
Raman spectra of the various structures obtained upon Si deposition at room temperature RT, 220, 25...
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(a) Raman spectra recorded on samples after Si deposition at room temperature with coverages of 1 M...
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Fitted Raman spectra of silicene-related structures: dominant (3times3)/(4×4) (epitaxial silicene) ...
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(a) LEED pattern of the sample prepared at 280 °C. The integer-order diffraction spots of Ag(111) a...
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Reduced phase diagram of Si structures that can be grown on the Ag(111) surface at various depositi...
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Beilstein J. Nanotechnol. 2017, 8, 1357–1365, doi:10.3762/bjnano.8.137
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