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1 article(s) from Zhang, Miao

Probing tribological evolution in atomically thin MoS₂ at different scales

Xingzhong Zeng and
Miao Zhang

Beilstein J. Nanotechnol. 2026, 17, 586–597, doi:10.3762/bjnano.17.40

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Figure 1: (a) AFM topographic image of atomically thin MoS₂ along with the cross-sectional height profiles in...

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Figure 2: Lateral forces versus scanning distances showing the atomic-scale stick–slip behavior measured on (...

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Figure 3: Lateral force (a) trace and (b) retrace curves measured on 1L MoS₂ under different loads. (c, d) Pe...

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Figure 4: Expanded images of the chosen slip motions extracted from (a–e) lateral force trace curves and (f–j...

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Figure 5: Slip distance versus load. The slip distances in (a) and (b) are obtained from the expanded lateral...

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Figure 6: Lateral force (a) trace and (b) retrace curves measured on 1L MoS₂ under the loads from 60 to 100 n...

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Figure 7: Lateral force (a) trace and (b) retrace curves measured on 4L MoS₂ under different loads. (c, d) De...

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Figure 8: Expanded images of chosen slip motions extracted from (a–e) lateral force trace curves in Figure 7a and (f–j...

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Figure 9: Slip distance versus load. The slip distances in (a) and (b) are obtained from the expanded lateral...

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Published 06 May 2026

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Probing tribological evolution in atomically thin MoS2 at different scales

Probing tribological evolution in atomically thin MoS₂ at different scales