2 article(s) from von Schmidsfeld, Alexander

Signal generation in dynamic interferometric displacement detection

  • Knarik Khachatryan,
  • Simon Anter,
  • Michael Reichling and
  • Alexander von Schmidsfeld

Beilstein J. Nanotechnol. 2024, 15, 1070–1076, doi:10.3762/bjnano.15.87

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Published 20 Aug 2024

Understanding interferometry for micro-cantilever displacement detection

  • Alexander von Schmidsfeld,
  • Tobias Nörenberg,
  • Matthias Temmen and
  • Michael Reichling

Beilstein J. Nanotechnol. 2016, 7, 841–851, doi:10.3762/bjnano.7.76

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Published 10 Jun 2016
 
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