|Since 1997||Professor of Experimental Physics (Ordinarius) at the Department of Physics at the Universität Basel, Switzerland|
|1992 - 1995||IBM Research Center Zurich, Switzerland|
|1990||Dr. phil. nat. on force microscopy with ionic crystals and layered materials at the Universität Basel|
His research is focused on the advancement of scanning probe microscopy. The interaction mechanisms of non-contact and contact force microscopy are investigated. Special emphasis is made on the dissipation mechanisms on the nanometer scale, where phenomena, such as atomic stick-slip are investigated.
Prof. Meyer edited the Thematic Series in the Beilstein Journal of Nanotechnology:
High-resolution electrical and chemical characterization of nm-scale organic and inorganic devices (together with Dr. Pierre Eyben)
Visit the homepage of Prof. Meyer.