Single-layer graphene oxide film grown on α-Al₂O₃(0001) for use as an adsorbent

• Shiro Entani,
• Mitsunori Honda,
• Masaru Takizawa and
• Makoto Kohda

Beilstein J. Nanotechnol. 2025, 16, 1082–1087, doi:10.3762/bjnano.16.79

• Figure 1 shows an atomic force microscopy (AFM) image of SLG and SLGO on α-Al2O3(0001) substrates. The as-grown SLG film has an atomically flat surface and wrinkles with its height less than 0.4 nm [18]. The single layer of graphene was confirmed through X-ray photoelectron spectroscopy (XPS) peak

• was removed from the SLGO surface by water rinsing and then the Cs-adsorbed SLGO specimen was introduced in the XPS chamber kept at ultra-high vacuum. The surface morphology of SLGO was examined using atomic force microscopy (AFM, SII SAP300). AFM images of (a) SLG/α-Al2O3(0001) and (b) SLGO/α-Al2O3

Piezoelectricity of hexagonal boron nitrides improves bone tissue generation as tested on osteoblasts

• Sevin Adiguzel,
• Nilay Cicek,
• Zehra Cobandede,
• Feray B. Misirlioglu,
• Hulya Yilmaz and
• Mustafa Culha

Beilstein J. Nanotechnol. 2025, 16, 1068–1081, doi:10.3762/bjnano.16.78

• evaluated. The synthesized hBNs and purchased BaTiO3 were used after their full characterization by imaging and spectroscopic techniques. The piezoelectric behavior of both NMs was evaluated using piezoresponse force microscopy (PRFM). During in vitro studies, the piezoelectricity of the NMs was stimulated

• hBN. The materials were characterized using spectroscopic, imaging, and thermal techniques, followed by assessment of their piezoelectric properties via piezoresponse force microscopy (PRFM). In vitro studies on human osteoblasts (HOb) under ultrasound (US) exposure examined proliferation, cellular

• -Vis-NIR) measured optical properties across the 200–800 nm range, while dynamic light scattering (DLS, Malvern Panalytical) provided data on hydrodynamic size and zeta potential after dispersing 1 mg of material in 1 mL of deionized water and sonicating for 30 min. Finally, piezoresponse force

Soft materials nanoarchitectonics: liquid crystals, polymers, gels, biomaterials, and others

• Katsuhiko Ariga

Beilstein J. Nanotechnol. 2025, 16, 1025–1067, doi:10.3762/bjnano.16.77

Time-resolved probing of laser-induced nanostructuring processes in liquids

• Maximilian Spellauge,
• David Redka,
• Mianzhen Mo,
• Changyong Song,
• Heinz Paul Huber and
• Anton Plech

Beilstein J. Nanotechnol. 2025, 16, 968–1002, doi:10.3762/bjnano.16.74

Shape, membrane morphology, and morphodynamic response of metabolically active human mitochondria revealed by scanning ion conductance microscopy

• Eric Lieberwirth,
• Anja Schaeper,
• Regina Lange,
• Ingo Barke,
• Simone Baltrusch and
• Sylvia Speller

Beilstein J. Nanotechnol. 2025, 16, 951–967, doi:10.3762/bjnano.16.73

• processes and warrants further investigation. Scanning probe microscopy (SPM) methods, such as atomic force microscopy (AFM), have been employed to image mitochondria in liquid, showing features of both the inner and outer membrane [22][23][24]. However, AFM measurements are influenced by the cantilever

• isolated mitochondria. Remarkably, the geometric and mechanical properties of microtubules are comparable to those of the nanopipette. Microtubules are hollow structures with an opening diameter of 18 nm and a total diameter of 25–30 nm [42][43]. Their pushing force, in the range of 3–4 pN [44], is similar

• metabolically active structures, as samples remain immersed in a nutrient medium and are not physically contacted. Unlike AFM, SICM measurements exert no mechanical force directly on the sample, and the ion currents involved are minimal. Although electric fields diminish rapidly over short distances [27][28][51

Tendency in tip polarity changes in non-contact atomic force microscopy imaging on a fluorite surface

• Bob Kyeyune,
• Philipp Rahe and
• Michael Reichling

Beilstein J. Nanotechnol. 2025, 16, 944–950, doi:10.3762/bjnano.16.72

• Bob Kyeyune Philipp Rahe Michael Reichling Institut für Physik, Universität Osnabrück, Barbarastraße 7, 49076 Osnabrück, Germany 10.3762/bjnano.16.72 Abstract We investigate the impact of tip changes on atomic-scale non-contact atomic force microscopy (NC-AFM) contrast formation when imaging a

• . Keywords: atomic resolution imaging; calcium fluoride surface; interaction force; non-contact atomic force microscopy (NC-AFM); tip change; Introduction Non-contact atomic force microscopy (NC-AFM) [1] is a surface science tool that has been used to atomically resolve surfaces of semiconductor and

• ‘dark’. In NC-AFM, the frequency shift Δf is proportional to the weighted average of the tip–sample interaction force gradient [30]. Attractive forces mostly exhibiting a positive force gradient are considered as negative and yield a negative Δf according to a generally accepted convention. When

Focused ion beam-induced platinum deposition with a low-temperature cesium ion source

• Thomas Henning Loeber,
• Bert Laegel,
• Meltem Sezen,
• Feray Bakan Misirlioglu,
• Edgar J. D. Vredenbregt and
• Yang Li

Beilstein J. Nanotechnol. 2025, 16, 910–920, doi:10.3762/bjnano.16.69

• magnetic or superconductive structures can be created [1][2][3][4]. Also, specific mechanical structures on atomic force microscopy (AFM) cantilevers can be made [5][6]. In the literature, four mechanisms are used to explain the complex process of focused ion beam-induced deposition (FIBID) [5][7]; the

Ar⁺ implantation-induced tailoring of RF-sputtered ZnO films: structural, morphological, and optical properties

• Manu Bura,
• Divya Gupta,
• Arun Kumar and
• Sanjeev Aggarwal

Beilstein J. Nanotechnol. 2025, 16, 872–886, doi:10.3762/bjnano.16.66

• in grazing incidence angle X-ray diffraction patterns. Atomic force microscopy images show grain size reduction and a fall in the surface roughness value of films after implantation. The implantation-induced structural modifications are further correlated with the variation in diffuse reflectance

• using a WITec alpha300 RA Raman spectrometer under excitation with a 532 nm solid-state diode laser operated at 10 mW. The topography of the films is examined using atomic force microscopy (AFM) with a Bruker Multimode 8 instrument. The surface morphology of pristine and implanted films is further

• ) mode both at the Γ and K–M points of the Brillouin zone shows softening and broadening with increasing argon ion fluence. Also, enhancement in peak intensity of both the peaks reveals the increases in lattice defects with increasing ion fluence. Morphological analysis Atomic force microscopy The

Supramolecular hydration structure of graphene-based hydrogels: density functional theory, green chemistry and interface application

• Hon Nhien Le,
• Duy Khanh Nguyen,
• Minh Triet Dang,
• Huyen Trinh Nguyen,
• Thi Bang Tam Dao,
• Trung Do Nguyen,
• Chi Nhan Ha Thuc and
• Van Hieu Le

Beilstein J. Nanotechnol. 2025, 16, 806–822, doi:10.3762/bjnano.16.61

• supramolecular hydration structures that preserve graphene nanosheets from the restacking through hydrophobic force, van der Waals force, and π–π interaction. In this manuscript, density functional theory and high-performance computing (HPC) are used for modeling and calculating van der Waals force between

• graphene nanosheets in water-intercalated AB bilayer graphene structures. A layer of water molecules significantly decreases the intersheet van der Waals force. A novel hydrogel of graphene oxide–silica gel–zinc hydroxide (GO-SG-ZH) is experimentally synthesized to demonstrate the advantages of hydrated

• interactions, a type of van der Waals force, for supramolecular attraction [9]. Particularly, graphene sheets with a large surface area and π-conjugated network are likely to stack together through hydrophobic agglomeration and π–π interaction. Although π–π interactions are generally weaker than hydrogen

Morphology and properties of pyrite nanoparticles obtained by pulsed laser ablation in liquid and thin films for photodetection

• Akshana Parameswaran Sreekala,
• Bindu Krishnan,
• Rene Fabian Cienfuegos Pelaes,
• David Avellaneda Avellaneda,
• Josué Amílcar Aguilar-Martínez and
• Sadasivan Shaji

Beilstein J. Nanotechnol. 2025, 16, 785–805, doi:10.3762/bjnano.16.60

• nanoparticle synthesis by PLAL. For instance, it has been reported that the density and viscosity of the surrounding liquid influence the expansion of the plasma plume. The expansion dynamics of the plume differ due to the larger opposing force induced by the increased viscosity of the solvent, which in turn

Thickness dependent oxidation in CrCl₃: a scanning X-ray photoemission and Kelvin probe microscopies study

• Shafaq Kazim,
• Rahul Parmar,
• Maryam Azizinia,
• Matteo Amati,
• Muhammad Rauf,
• Andrea Di Cicco,
• Seyed Javid Rezvani,
• Dario Mastrippolito,
• Luca Ottaviano,
• Tomasz Klimczuk,
• Luca Gregoratti and
• Roberto Gunnella

Beilstein J. Nanotechnol. 2025, 16, 749–761, doi:10.3762/bjnano.16.58

• particular technological interest, even more in the case of chromium trihalides (CrX3, X = Cl, Br, and I), whose longer lifetime under ambient conditions is particularly intriguing. By using synchrotron-based scanning photoelectron microscopy with a resolution of 0.1 μm and Kelvin probe force microscopy, we

• oxidation or the introduction of surface vacancies, a novel and versatile approach is unveiled for the development of low-dimensional multifunctional nanodevices. Keywords: chemical mapping; CrX3; Kelvin probe force microscopy; mechanical exfoliation; scanning photoelectron microscopy (SPEM); two

• correlation between the microscopic results and the surface potential of CrCl3 flakes at the nanoscale level using Kelvin probe force microscopy (KPFM) [28]. KPFM is mainly employed to measure the local contact potential difference between the conductive AFM tip and the sample, allowing for high-resolution

Nanostructured materials characterized by scanning photoelectron spectromicroscopy

• Matteo Amati,
• Alexey S. Shkvarin,
• Alexander I. Merentsov,
• Alexander N. Titov,
• María Taeño,
• David Maestre,
• Sarah R. McKibbin,
• Zygmunt Milosz,
• Ana Cremades,
• Rainer Timm and
• Luca Gregoratti

Beilstein J. Nanotechnol. 2025, 16, 700–710, doi:10.3762/bjnano.16.54

• suitable substrates for characterization by scanning probe microscopy and SPEM. An atomic force microscopy (AFM) image of a typical InP p–n junction nanowire is shown in Figure 2a, confirming a homogeneous shape with a nanowire length of about 2.5 µm and a diameter of about 200 nm, fluctuating only by a

High-temperature epitaxial growth of tantalum nitride thin films on MgO: structural evolution and potential for SQUID applications

• Michelle Cedillo Rosillo,
• Oscar Contreras López,
• Jesús Antonio Díaz,
• Agustín Conde Gallardo and
• Harvi A. Castillo Cuero

Beilstein J. Nanotechnol. 2025, 16, 690–699, doi:10.3762/bjnano.16.53

• , atomic force microscopy, and transmission electron microscopy analyses revealed that the TaN films exhibit excellent crystallinity and smooth surface morphology, when deposited at optimal temperatures of 750 and 850 °C. The films exhibit superconducting transition temperatures (Tc) ranging from 5.0 to

• . Atomic force microscopy (AFM, XE-70 Park Systems) in contact mode was used to study the surface morphology of the films. The synthesis protocol used in this study was modified from the work reported by Quintanar-Zamora et al. [15] by varying the substrate temperature and the nitrogen pressure. Results

The impact of tris(pentafluorophenyl)borane hole transport layer doping on interfacial charge extraction and recombination

• Konstantinos Bidinakis and
• Stefan A. L. Weber

Beilstein J. Nanotechnol. 2025, 16, 678–689, doi:10.3762/bjnano.16.52

• in solar cells based on these materials. To do so on operating solar cells, we created samples with exposed cross-sections and examined their potential profile distributions with Kelvin probe force microscopy (KPFM), implementing our comprehensive measurement protocol. Using the Lewis acid tris

• ; hole transport layer doping; Kelvin probe force microscopy; perovskite solar cells; Introduction Perovskite solar cells (PSCs) are a promising class of photovoltaic material that exhibits high power conversion efficiencies and relies on a low-cost solution-processed fabrication method [1][2][3][4]. At

• force microscopy (KPFM) is an important tool for conducting such studies, enabling the measurement of the perovskite’s surface potential by monitoring the electrostatic force between the surface and a conductive probe (See Supporting Information File 1, Section 1). This measurement can provide insights

Nanoscale capacitance spectroscopy based on multifrequency electrostatic force microscopy

• Pascal N. Rohrbeck,
• Lukas D. Cavar,
• Franjo Weber,
• Peter G. Reichel,
• Mara Niebling and
• Stefan A. L. Weber

Beilstein J. Nanotechnol. 2025, 16, 637–651, doi:10.3762/bjnano.16.49

• of Mainz, Staudingerweg 7, 55128 Mainz, Germany Institute for Photovoltaics, University of Stuttgart, Pfaffenwaldring 47, 70569 Stuttgart, Germany 10.3762/bjnano.16.49 Abstract We present multifrequency heterodyne electrostatic force microscopy (MFH-EFM) as a novel electrostatic force microscopy

• , enabling the measurement of the local dielectric function over a wide range of frequencies. We demonstrate the reliable operation of MFH-EFM using standard atomic force microscopy equipment plus an external lock-in amplifier up to a frequency of 5 MHz, which can in principle be extended to gigahertz

• nanoscale systems across materials science, biology, and nanotechnology, complementing established methods in the field. Keywords: atomic force microscopy; capacitance gradients; dielectric constant; dielectric spectroscopy; heterodyne frequency mixing; Kelvin probe force microscopy; multifrequency AFM

Polyurethane/silk fibroin-based electrospun membranes for wound healing and skin substitute applications

• Iqra Zainab,
• Zohra Naseem,
• Syeda Rubab Batool,
• Muhammad Waqas,
• Ahsan Nazir and
• Muhammad Anwaar Nazeer

Beilstein J. Nanotechnol. 2025, 16, 591–612, doi:10.3762/bjnano.16.46

• through a capillary, and a high voltage is applied to charge the solution’s particles, which produces an attractive force [54]. When the solution’s surface tension is overcome at a critical voltage, a jet shoots out of the capillary’s tip toward a grounded collector (Figure 2A) [55]. The morphology of

Electron beam-based direct writing of nanostructures using a palladium β-ketoesterate complex

• Chinmai Sai Jureddy,
• Krzysztof Maćkosz,
• Aleksandra Butrymowicz-Kubiak,
• Iwona B. Szymańska,
• Patrik Hoffmann and
• Ivo Utke

Beilstein J. Nanotechnol. 2025, 16, 530–539, doi:10.3762/bjnano.16.41

• Oxford Instruments. EDX was performed with 6 keV electron beam at 500 pA, and the signals were collected for 60 s. Atomic force microscopy (AFM) measurements were conducted on an NT-MDT NTEGRA Spectra system, and data was analyzed using Gwyddion and Origin software. To accurately obtain the composition

N₂⁺-implantation-induced tailoring of structural, morphological, optical, and electrical characteristics of sputtered molybdenum thin films

• Usha Rani,
• Kafi Devi,
• Divya Gupta and
• Sanjeev Aggarwal

Beilstein J. Nanotechnol. 2025, 16, 495–509, doi:10.3762/bjnano.16.38

• the same nominal film thickness after implantation. Keywords: atomic force microscopy; grazing angle X-ray diffractometer; Keithley parametric analyzer; Mo thin films; RF sputtering; spectroscopic ellipsometry; Introduction Molybdenum thin films have garnered significant attention in diverse

• of 1.5405 Å. Measurements were conducted with a fixed incident angle of 0.5°, and the X-ray tube was operated at 40 kV and 40 mA. The surface morphology was analyzed using a Bruker Multimode-8 atomic force microscopy (AFM). The optical characteristics of the molybdenum thin films were analyzed using

• thickness increased from 150 to 300 nm, signifying a reduction in interplanar spacing. The decrease in interplanar spacing is a direct consequence of the compressive force induced by nitrogen implantation. During the deposition process, Mo thin films exhibit different types of stress due to changes in

Performance optimization of a microwave-coupled plasma-based ultralow-energy ECR ion source for silicon nanostructuring

• Joy Mukherjee,
• Safiul Alam Mollick,
• Tanmoy Basu and
• Tapobrata Som

Beilstein J. Nanotechnol. 2025, 16, 484–494, doi:10.3762/bjnano.16.37

• confirm the formation of nanostructures as observed from atomic force microscopy (AFM) images. The thickness of the amorphous thin layer is in good agreement with Monte Carlo simulations (SRIM) [31]. The article further investigates and explains the optical response (by UV–vis spectrometry) of the

Impact of adsorbate–substrate interaction on nanostructured thin films growth during low-pressure condensation

• Alina V. Dvornichenko,
• Vasyl O. Kharchenko and
• Dmitrii O. Kharchenko

Beilstein J. Nanotechnol. 2025, 16, 473–483, doi:10.3762/bjnano.16.36

• calculating the effective potential V(x) related to the reaction force Equation 10 as . The form of the potential V(x) at different points of the stability diagram at α = 0.03 is shown in Figure 2b. From Figure 2a, one finds that an increase in the adsorption rate α requires smaller values of the interaction

ReactorAFM/STM – dynamic reactions on surfaces at elevated temperature and atmospheric pressure

• Tycho Roorda,
• Hamed Achour,
• Matthijs A. van Spronsen,
• Marta E. Cañas-Ventura,
• Sander B. Roobol,
• Willem Onderwaater,
• Mirthe Bergman,
• Peter van der Tuijn,
• Gertjan van Baarle,
• Johan W. Bakker,
• Joost W. M. Frenken and
• Irene M. N. Groot

Beilstein J. Nanotechnol. 2025, 16, 397–406, doi:10.3762/bjnano.16.30

• , capable of studying materials under industrially relevant conditions. Here we show current developments of the ReactorAFM/STM, implementing a qPlus sensor to add the ability of combining atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques to study the geometric and electronic

• conductive substrate limits STM techniques in relevant industrial applications involving such more complex catalysts. For this reason, an atomic force microscopy (AFM) version of the high-pressure STM employing a quartz tuning fork (QTF) was introduced to overcome this limitation [16]. Unlike STM, which uses

• –Tropsch synthesis (FTS). Challenges while applying a tuning fork as force sensor A drawback of the QTF as a force sensor is that its temperature sensitivity increases with increasing temperatures; in fact, it can even serve as a micro temperature sensor [18]. As a result, temperature fluctuations while

Development of a mucoadhesive drug delivery system and its interaction with gastric cells

• Ahmet Baki Sahin,
• Serdar Karakurt and
• Deniz Sezlev Bilecen

Beilstein J. Nanotechnol. 2025, 16, 371–384, doi:10.3762/bjnano.16.28

• one of the driving force behind mucoadhesion [57]. Therefore, the presence of the Eudragit polymer layer on the designed nanoparticles is beneficial for the enhancement of the electrostatic interactions between the nanoparticles and the gastric mucus, thus increasing their entrapment into the mucus

Vortex lattices of layered HTSCs at different vortex–vortex interaction potentials

• Valerii P. Lenkov,
• Anastasia N. Maksimova,
• Anna N. Moroz and
• Vladimir A. Kashurnikov

Beilstein J. Nanotechnol. 2025, 16, 362–370, doi:10.3762/bjnano.16.27

• distances greater than 10λ, repulsion is observed). In this work, the formation of vortex clusters and their motion under the action of the Lorentz force were investigated. Since their interaction potential is similar to intertype, our results are applicable to them. A description of the mechanism of the

Tailoring of physical properties of RF-sputtered ZnTe films: role of substrate temperature

• Kafi Devi,
• Usha Rani,
• Arun Kumar,
• Divya Gupta and
• Sanjeev Aggarwal

Beilstein J. Nanotechnol. 2025, 16, 333–348, doi:10.3762/bjnano.16.25

• the optical bandgap of the films can be tuned from 1.47 ± 0.02 eV to 3.11 ± 0.14 eV. The surface morphology of the films studied using atomic force microscopy reveals that there is uniform grain growth on the surface. Various morphological parameters such as roughness, particle size, particle density

• ) spectrophotometer under 320 nm excitation produced by a xenon arc lamp. For investigating the surface topography, atomic force microscopy (AFM) micrographs of ZnTe/Qz films were recorded (scan area 2 × 2 µm2) using a Bruker multimode-8 AFM in the ScanAsyst mode at the Ion Beam Centre, Kurukshetra University. The

Graphene oxide–chloroquine conjugate induces DNA damage in A549 lung cancer cells through autophagy modulation

• Braham Dutt Arya,
• Sandeep Mittal,
• Prachi Joshi,
• Alok Kumar Pandey,
• Jaime E. Ramirez-Vick,
• Govind Gupta and
• Surinder P. Singh

Beilstein J. Nanotechnol. 2025, 16, 316–332, doi:10.3762/bjnano.16.24

• -resolution transmission electron microscope (Technai G2 F30 STWIN, Japan), field emission scanning electron microscope (FEI, Quanta FEG 450, USA), and atomic force microscope (Nanoscope, Veeco V, USA) [28][29][30]. Cell culture A549 cells from the American Type Culture Collection (ATCC, Manassas, VA, USA

• ][51]. Further, the morphology and topography of GO nanosheets were analyzed employing atomic force microscopy. Supporting Information File 1, Figure S2 reveals the appearance of few layered interlocked GO nanosheets, and the topographical analysis reveals the thickness in the range of 0.6 to 1.06 nm

• GO and GO–Chl nanoconjugate via UV–vis, FTIR, Raman Spectroscopy, FESEM, and HRTEM. Figure S2 shows the atomic force microscopy-based topographical analysis of GO nanosheets. Figure S3 represents the XPS survey spectra of GO, GO–Chl, and Chl. Table S1 shows the summary of fitting parameters for the