Tip-sample interactions on graphite studied using the wavelet transform

• Giovanna Malegori and
• Gabriele Ferrini

Beilstein J. Nanotechnol. 2010, 1, 172–181, doi:10.3762/bjnano.1.21

• oscillations of a cantilever with an interacting tip. This analysis allows to retrieve the force gradients, the forces and the Hamaker constant in a measurement time of less than 40 ms. Keywords: AFM; force; graphite; thermal excitation; wavelet transforms; Introduction The non-contact atomic force

• microscopy (NC-AFM) is a powerful tool to study not only the surface topography, but also the mechanical and chemical characteristics of the sample at the nanoscale [1][2][3]. The tip of an excited cantilever is sensitive to both forces and force gradients, when approaching the sample surface. The response