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Preparation and characterization of supported magnetic nanoparticles prepared by reverse micelles

  • Ulf Wiedwald,
  • Luyang Han,
  • Johannes Biskupek,
  • Ute Kaiser and
  • Paul Ziemann

Beilstein J. Nanotechnol. 2010, 1, 24–47, doi:10.3762/bjnano.1.5

Graphical Abstract
  • and electronic structure of the sample. Moreover, due to its surface sensitivity, XPS can be used to obtain information on surface oxidation, phase separation and segregation both in films and in particles [66]. In this section some important findings are discussed which have impact on the
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Published 22 Nov 2010
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