Beilstein J. Nanotechnol.2010,1, 24–47, doi:10.3762/bjnano.1.5
and electronic structure of the sample. Moreover, due to its surface sensitivity, XPS can be used to obtain information on surface oxidation, phaseseparation and segregation both in films and in particles [66]. In this section some important findings are discussed which have impact on the
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Scheme 1:
Preparation of NPs by a reverse micelle technique. PS-b-P2VP or PS-b-P4VP is dispersed in anhydrous...