Infrared receptors in pyrophilous (“fire loving”) insects as model for new un-cooled infrared sensors

• David Klocke,
• Anke Schmitz,
• Helmut Soltner,
• Herbert Bousack and
• Helmut Schmitz

Beilstein J. Nanotechnol. 2011, 2, 186–197, doi:10.3762/bjnano.2.22

• . Experimental Morphological methods used are all based on well established light and electron microscopical procedures. Mechanical tests were conducted in a nanomechanical test system capable of normal loading as well as in situ scanning probe microscopy (SPM) (TriboScope; Hysitron, Minneapolis, USA

Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy

• Thomas König,
• Georg H. Simon,
• Lars Heinke,
• Leonid Lichtenstein and
• Markus Heyde

Beilstein J. Nanotechnol. 2011, 2, 1–14, doi:10.3762/bjnano.2.1

• have been measured simultaneously. The colors indicate different tip-sample distances. Note that the displacement of 4.5 Å has been chosen arbitrarily, since absolute values are generally unknown in scanning probe microscopy. b) The oscillation amplitude is constant during scan process. This excludes

Scanning probe microscopy and related methods

• Ernst Meyer

Beilstein J. Nanotechnol. 2010, 1, 155–157, doi:10.3762/bjnano.1.18

• . Scanning probe microscopy (SPM) uses probing tips to map properties, such as topography, local adhesive forces, elasticity, friction or magnetic properties. In the emerging fields of nanoscience and nanotechnology these types of microscopes help to characterize the nanoworld. In addition, local probes can

• the colleagues for their excellent contributions. Ernst Meyer Basel, December 2010 Scanning probe microscopy: A large familiy of microscopes, which have in common that they use local probes to characterize surfaces. AFM: Atomic Force MicroscopySTM: Scanning Tunneling Microscopy, PDM: Phase Detection