Beilstein J. Nanotechnol.2010,1, 3–13, doi:10.3762/bjnano.1.2
on the AFM images can be understood by comparing the tip-sampleinteraction forces obtained in PBS and 20% 2-propanol, respectively (Figure 5). Specifically, the thickness of the PEG layer (defined by the onset of repulsion) reduces from 26 nm in the brush-like state to 5 nm in the collapsed state
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Figure 1:
(A) Scanning electron microscope image of a silicon microcantilever array consisting of eight canti...