Structure, morphology, and magnetic properties of Fe nanoparticles deposited onto single-crystalline surfaces

• Armin Kleibert,
• Wolfgang Rosellen,
• Mathias Getzlaff and
• Joachim Bansmann

Beilstein J. Nanotechnol. 2011, 2, 47–56, doi:10.3762/bjnano.2.6

• Experiments on exposed mass-filtered Fe nanoparticles on (ferromagnetic) supports require in situ cluster deposition as well as surface sensitive analysis techniques performed under ultrahigh vacuum conditions. To motivate the need of our combined approach, we first introduce the arc cluster ion source (ACIS

• other pulsed light sources [26]. For the present experiments the PACIS design has been modified to allow a high and continuous flux of mass-filtered nanoparticles (size regime: 4 nm to 25 nm) with a moderate size distribution in surface science experiments [27][28]. The resulting ACIS is ultrahigh

• vacuum compatible, small in size to allow easy transportation and can be flexibly attached to different experimental stations, e.g., laboratory-based STM experiments, different end stations at synchrotron light sources such as BESSY (Berlin, Germany) and more recently, the Elmitech PEEM at the SIM

Oriented growth of porphyrin-based molecular wires on ionic crystals analysed by nc-AFM

• Thilo Glatzel,
• Lars Zimmerli,
• Shigeki Kawai,
• Ernst Meyer,
• Leslie-Anne Fendt and
• Francois Diederich

Beilstein J. Nanotechnol. 2011, 2, 34–39, doi:10.3762/bjnano.2.4

• their intermolecular π–π stacking. Experimental Experiments were performed under ultrahigh vacuum (UHV) conditions with a base pressure below 10−10 mbar using a home built non-contact atomic force microscope operated at rt [39]. In the nc-AFM mode, the tip-sample distance is usually controlled by

Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy

• Thomas König,
• Georg H. Simon,
• Lars Heinke,
• Leonid Lichtenstein and
• Markus Heyde

Beilstein J. Nanotechnol. 2011, 2, 1–14, doi:10.3762/bjnano.2.1

• atomic force microscopy (FM-AFM) or dynamic force microscopy (DFM). For the stability of tip and sample as well as for the reduction of piezo creep, piezo hysteresis, thermal drift and noise level, the setup was operated in ultrahigh vacuum (UHV) at low temperature (5 K). The resulting high stability