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Search for "(F)EBID" in Full Text gives 1 result(s) in Beilstein Journal of Nanotechnology.

Simulation of electron transport during electron-beam-induced deposition of nanostructures

  • Francesc Salvat-Pujol,
  • Harald O. Jeschke and
  • Roser Valentí

Beilstein J. Nanotechnol. 2013, 4, 781–792, doi:10.3762/bjnano.4.89

Graphical Abstract
  • during post-growth electron-beam treatments. Keywords: electron backscattering; electron transport; (F)EBID; Monte Carlo simulation; PENELOPE; Introduction Electron-beam-induced deposition (EBID) [1][2][3] is a suitable method for the template-free fabrication of nanostructures. Molecules of a
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Published 22 Nov 2013
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