Controlling the dispersion of supported polyoxometalate heterogeneous catalysts: impact of hybridization and the role of hydrophilicity–hydrophobicity balance and supramolecularity

• Gijo Raj,
• Colas Swalus,
• Eglantine Arendt,
• Pierre Eloy,
• Michel Devillers and
• Eric M. Gaigneaux

Beilstein J. Nanotechnol. 2014, 5, 1749–1759, doi:10.3762/bjnano.5.185

• pure POM, pure DODA, and hybrid solutions were obtained by depositing a drop of each solution (about 9.5 µL) either on to freshly cleaved HOPG (ZYB grade, Bruker AFM probes) or mica surfaces (Agar scientific). The sample was allowed to dry under ambient conditions for more than 48 h before analysis

• , and the hybrid materials were imaged by using an etched Si tapping mode cantilever of the TESP type (Bruker AFM probes), having a nominal radius of curvature of 8 nm. Samples were glued on a magnetic stainless steel disc by using double-sided adhesive tape before mounting on to the “J” type

Hydrophobic interaction governs unspecific adhesion of staphylococci: a single cell force spectroscopy study

• Nicolas Thewes,
• Peter Loskill,
• Philipp Jung,
• Henrik Peisker,
• Markus Bischoff,
• Mathias Herrmann and
• Karin Jacobs

Beilstein J. Nanotechnol. 2014, 5, 1501–1512, doi:10.3762/bjnano.5.163

• with 1 mL. Then, the bacteria were either used immediately or stored less than two hours at 4 °C. For the preparation of the bacterial AFM probes, bacterial solution was again diluted 1:6. Preparation of the bacterial probes Bacterial probes are based on tipless cantilevers (MLCT-O, Bruker, Billerica

• curves summarized in bar I. Obviously, the adhesive mechanism of S. carnosus on hydrophobic OTS surface differs strongly from that on a hydrophilic Si wafer, as the adhesion of S. carnosus to hydrophilic Si wafers is barely resolvable. From force spectroscopy measurements with multiple bacteria as AFM

• probes (30–50 bacteria), we learned that on hydrophilic silicon oxide surfaces, the adhesion force is roughly an order of magnitude lower than on OTS-Si wafers [13]. Hence, the adhesion force of a single bacterium on a hydrophilic surface is expected to be below the experimental resolution (about 50 pN

Highly NO₂ sensitive caesium doped graphene oxide conductometric sensors

• Carlo Piloto,
• Marco Notarianni,
• Mahnaz Shafiei,
• Elena Taran,
• Dilini Galpaya,
• Cheng Yan and
• Nunzio Motta

Beilstein J. Nanotechnol. 2014, 5, 1073–1081, doi:10.3762/bjnano.5.120

• data shown here, we used conductive (Pt coated) AFM probes (NSG03 model from NT-MDT) with a nominal resonant frequency between 50 and 150 kHz. The GO and GO-Cs samples were deposited on gold-coated mica substrates from a liquid suspension (5 μg/mL). The Kelvin voltage was maintained with an integral

Study of mesoporous CdS-quantum-dot-sensitized TiO₂ films by using X-ray photoelectron spectroscopy and AFM

• Mohamed N. Ghazzal,
• Robert Wojcieszak,
• Gijo Raj and
• Eric M. Gaigneaux

Beilstein J. Nanotechnol. 2014, 5, 68–76, doi:10.3762/bjnano.5.6

• evaporated in air prior to the analysis of the samples. AFM experiments were performed analogously to [15] by using a Nanoscope V multimode AFM (NanoSurfaces Business, Bruker Corporation, Santa Barbara, CA) in tapping mode (TM-AFM). Etched Si tapping mode cantilevers (TESP type, Bruker AFM probes), with a

Noise performance of frequency modulation Kelvin force microscopy

• Heinrich Diesinger,
• Dominique Deresmes and
• Thierry Mélin

Beilstein J. Nanotechnol. 2014, 5, 1–18, doi:10.3762/bjnano.5.1

• noise spectra in agreement with the measurements. The choice of the AC modulation frequency to be four times the intended bandwidth has been proposed and justified as design rule. Based on the acquired knowledge, the KFM performance has been modeled for three other well-known AFM probes. A crossover

Dynamic nanoindentation by instrumented nanoindentation and force microscopy: a comparative review

• Sidney R. Cohen and
• Estelle Kalfon-Cohen

Beilstein J. Nanotechnol. 2013, 4, 815–833, doi:10.3762/bjnano.4.93

Large-scale analysis of high-speed atomic force microscopy data sets using adaptive image processing

• Blake W. Erickson,
• Séverine Coquoz,
• Jonathan D. Adams,
• Daniel J. Burns and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2012, 3, 747–758, doi:10.3762/bjnano.3.84

• , forming bilayers through vesicle fusion. Surfaces were allowed to incubate for at least a half hour in a humid environment at room temperature. AFM imaging in air Images were captured on a Multimode system with an E-scanner (Bruker Nano: Santa Barbara, CA, USA). Standard TESPA (Bruker AFM Probes

• . Quantitative Nanomechanical Mapping (QNM) – AFM imaging in fluid Images were captured on a Multimode system with an E-scanner (Bruker Nano: Santa Barbara, CA, USA). A standard DNP-A (Bruker AFM Probes: Camarillo, CA, USA) cantilever was used with a spring constant of 0.40 N/m. Images at 5 µm were captured at

Repulsive bimodal atomic force microscopy on polymers

• Alexander M. Gigler,
• Christian Dietz,
• Maximilian Baumann,
• Nicolás F. Martinez,
• Ricardo García and
• Robert W. Stark

Beilstein J. Nanotechnol. 2012, 3, 456–463, doi:10.3762/bjnano.3.52

• (APD) measurements on both freshly cleaned silicon and polystyrene (nominal Young’s modulus of 2.7 GPa; test sample from Bruker AFM Probes, Camarillo, CA) using a Cypher AFM (Asylum Research, Santa Barbara, CA). All of the components required for bimodal operation were implemented in the instrument by

Direct-write polymer nanolithography in ultra-high vacuum

• Woo-Kyung Lee,
• Minchul Yang,
• Arnaldo R. Laracuente,
• William P. King,
• Lloyd J. Whitman and
• Paul E. Sheehan

Beilstein J. Nanotechnol. 2012, 3, 52–56, doi:10.3762/bjnano.3.6

• onto atomic force microscope (AFM) probes that could be heated to control the ink viscosity. Then, the ink-coated probes were placed into an ultra-high vacuum (UHV) AFM and used to write polymer nanostructures on surfaces, including surfaces cleaned in UHV. Controlling the writing speed of the tip

Switching adhesion forces by crossing the metal–insulator transition in Magnéli-type vanadium oxide crystals

• Bert Stegemann,
• Matthias Klemm,
• Siegfried Horn and
• Mathias Woydt

Beilstein J. Nanotechnol. 2011, 2, 59–65, doi:10.3762/bjnano.2.8

• representative crystals of all the batches were carried out to characterize the quality of the crystals. The MIT temperatures of the samples under study in the present work are displayed in Figure 1. Spherical AFM probe preparation The spherical AFM probes were prepared by attaching a microsphere of the desired