Beilstein J. Nanotechnol.2020,11, 1750–1756, doi:10.3762/bjnano.11.157
, Himeji, Hyogo 671-2280, Japan Institute for Nanoscience Design, Osaka University, 1-2 Machikaneyama, Toyonaka, Osaka 560-0043, Japan 10.3762/bjnano.11.157 Abstract The atomic arrangement of the Si(110)-(16×2) reconstruction was directly observed using noncontact atomic force microscopy (NC-AFM) at 78 K
between upper and lower terraces, which have not been reported using STM. These findings are key evidence for establishing an atomic model of the Si(110)-(16×2) reconstruction, which indeed has a complex structure.
Keywords: atomic force microscopy (AFM); noncontact atomic force microscopy (NC-AFM); Si
(110); Si(110)-(16×2); Introduction
The Si(110) surface, which is one of the low-index Si planes, has been attracting growing interest in the fields of industrial technology and surface science. From an industrial application perspective, it has been considered to be a promising material for p-type
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Figure 1:
AFM image (100 × 80 nm2) of the 16×2 reconstruction on Si(110). Solid and dotted rectangles represe...