Single-pass Kelvin force microscopy and dC/dZ measurements in the intermittent contact: applications to polymer materials

• Sergei Magonov and
• John Alexander

Beilstein J. Nanotechnol. 2011, 2, 15–27, doi:10.3762/bjnano.2.2

• of their constituents. These differences are best reflected in phase images in the amplitude modulation (AM) mode, which are obtained at elevated forces. Although the phase contrast is efficient in differentiating the rubbery, glassy and inorganic components of polymer blends and composites, its