Mechanical property measurements enabled by short-term Fourier-transform of atomic force microscopy thermal deflection analysis

• Thomas Mathias,
• Roland Bennewitz and
• Philip Egberts

Beilstein J. Nanotechnol. 2025, 16, 1952–1962, doi:10.3762/bjnano.16.136

• glass colloid probe on a HOPG sample (red circles), and (d) a diamond-coated silicon on silicon sample (blue circles). A red dashed line in each figure shows a fit to the experimental data using Equation 7. (a, b) Scanning electron microscopy images of the borosilicate glass colloid glued onto the

Studies of probe tip materials by atomic force microscopy: a review

• Ke Xu and
• Yuzhe Liu

Beilstein J. Nanotechnol. 2022, 13, 1256–1267, doi:10.3762/bjnano.13.104

• the direction of new probes and further promotes the broader and deeper application of scanning probe microscope (SPM). Keywords: AFM; carbon nanotube probe; colloid probe; metal probe; Introduction AFM represents a well-established technique for the investigation of the nanosurface morphology