Tendency in tip polarity changes in non-contact atomic force microscopy imaging on a fluorite surface

• Bob Kyeyune,
• Philipp Rahe and
• Michael Reichling

Beilstein J. Nanotechnol. 2025, 16, 944–950, doi:10.3762/bjnano.16.72

• constant-height mode using an atom-tracking and feed-forward system for instantaneous drift compensation [29]. All frequency shift (Δf) images are presented with regions of strong attractive tip–sample interaction depicted as ‘bright’ and regions of weak attractive or repulsive interaction reproduced as

Length-extension resonator as a force sensor for high-resolution frequency-modulation atomic force microscopy in air

• Hannes Beyer,
• Tino Wagner and
• Andreas Stemmer

Beilstein J. Nanotechnol. 2016, 7, 432–438, doi:10.3762/bjnano.7.38

• air using a length-extension resonator operating at small amplitudes. An additional slow feedback compensates for changes in the free resonance frequency, allowing stable imaging over a long period of time with changing environmental conditions. Keywords: ambient conditions; drift compensation

• . Experimental setup. a) Feedback scheme. The dashed parts enable the slow-drift compensation. Also shown is the LER soldered on a piece of a circuit board, which is glued to an L-shaped metal adapter piece. b) Image of the Cypher droplet holder with LER adapter piece fixed by two screws (white arrows). c